New Patent Databases on Ei Village

I am pleased to announce that we have added a new database, Ei Patents, to the Ei Village platform, which we use to access the engineering databases Compendex, Inspec, and NTIS. The addition of patents to the suite of databases we get on the Village allows us to search across a wide range of topics in engineering and applied science in a broad range of literature (patents, journal articles, conference papers, unclassified government documents, and technical reports) from within a single search interface.

Ei Patents includes records for patents issued by both the United States Patent & Trademark Office (US) and the European Patent Office (EP). The two patent databases can be searched together, separately, or in conjunction with Compendex, Inspec, and NTIS. Enhanced access to patent searching via the Village includes indexing, abstracting, and analytics. In addition, records in the databases link out to the full text of patents on the web.

You can connect to any of the databases (Compendex, Inspec, NTIS, or Ei Patents) by title via http://ublib.buffalo.edu/libraries/e-resources/DatabasesbyTitle.html
or go directly to http://www.engineeringvillage2.org (assuming you're authenticated) to check it out.